FOUNDED 1993  PIONEERS IN IR-FIBER AND REACTION MONITORING
ArtView™
Non-destructive Analysis of Museum and Gallery Objects
SYSTEMS HEADS & REACTORS SERVICES FIBER & CABLES

SOFTWARE

ArtView is a non-destructive IR reflectance tool for analyzing heritage and art objects.

ArtView operates in a non-contact mode, using a reflectance method to measure the mid-IR spectrum of artifacts. Mid-IR spectroscopy can distinguish a wide range of organic and mineral materials, even when data quality is less than optimal.

ArtView collects data by reflectance. Even quite rough or dull surfaces can reflect enough mid-IR radiation to generate a spectrum that can be used to identify materials, or make useful comparisons.

  • Set up the ArtView probe and bring an object close to the probe end, or point the probe at the surface of a very large object
  • Collect data for fifteen or thirty seconds
  • Sample a range of sites on the surface within a few minutes
  • View and compare spectra in real time
  • Compare spectra to each other, to known samples, to spectral libraries
  • Answer questions about art objects in minutes without destructive sampling


Ploeger et. al., Non-Invasive Mid-IR Fibre Optic Reflectance Spectroscopy Analysis of Painted Glass Magic Lantern Slides, 9th Int. Conf. on NDT of Art, Jerusalem, Israel, 25-30 May 2008

Ormsby et al., FTIR Studies of Wet Cleaning Treatments on Acrylic Paintings, e-PS, 2009, 6, 186-195

Williams, On-Site Non-Destructive Mid-IR Spectroscopy of Plastics in Museum Objects Using a Portable FTIR Spectrometer with Fiber-Optic Probe, Mat. Res. Soc. Symposium Proc. Vol. 462, 1997, 25-30

Miliani et al.,
Fiber-Optic FTIR Reflectance Spectroscopy: A Suitable Technique for in-Situ Studies of Mural Paintings, App. Spec. 61, 2007, 293-299

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